Advanced Latent Palm Print Comparison Class (Sirchie HQ) Nov 8-12, 2027
$695.00
SKU
PPC100-271108
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Course Overview
This course provides advanced training in palm print examination and is designed for latent print examiners who have foundational fingerprint training seeking to develop or deepen expertise in palm print analysis. Students will learn and discuss the ACE-V Methodology, palm topography, flexion crease interpretation, and the orientation and search strategies used in palm print casework.
Minimum Requirements
Each student must have completed a Basic Latent Fingerprint Comparison Course to be accepted in the Advanced Palm Print Analysis Course.
Curriculum
- The ACE-V Methodology and how it relates to the Scientific Method
- Palm print topography and its use in comparisons
- Establishing anatomical direction
- Palm print areas
- Major and minor flexion creases
- Palm print orientation and search clues
- Casework quality latent palm print comparisons
This class will be held at Sirchie's Headquarters in at 100 Hunter Place, Youngsville, NC Nov 8-12, 2027
Minimum Requirements for the class:
Each student must have attended and completed a Basic Latent Fingerprint Comparison Course to be accepted in the Advanced Latent Palm Print Comparison Course.
You need to attend this program if...
- You would like to learn how to recognize valuable search clues for latent palm prints
- You would like valuable training in latent palm print orientation and comparison techniques
- You want to understand value of Major and Minor Flexion Creases during comparisons
Many students have expressed the difficulty in comparing latent palm prints and asked for a course that addresses this and simulates routine case work type training.
This course was developed to meet these needs through combining lecture and latent print practical exercises.
This course has been approved for Certification and Recertification Training credit by the IAI
IAI Latent Print Certification Credit: 36 hours
Your Instructor: CJ Cavazos
CJ graduated from Purdue University with a degree in Sociology and minors in Psychology and Forensic Science. He then went on to Syracuse University to obtain his Master’s Degree in Forensic Science. CJ began his forensic career in 2014 with the North Carolina State Crime Laboratory (NCSCL) in the Latent Evidence Section as a Forensic Scientist I. At the NCSCL, CJ was trained in latent print examination and comparison and footwear examination and comparison. He became an IAI Certified Latent Print Examiner in 2017. In 2021, CJ took the position of Lead Fingerprint Specialist at the United States Secret Service in Washington DC. He provided technical guidance for the Latent Print Section and was the Training Coordinator for new examiners. In 2024, CJ joined the Treasury Inspector General for Tax Administration (TIGTA) as a Fingerprint Specialist. In addition to his professional roles, CJ taught an Introduction to the Science of Fingerprints course at NC State University and has presented lectures at the International Association for Identification and the Chesapeake Bay Division of the IAI. He is a past member of the North Carolina Division of the IAI and a current member of the parent body IAI.
Click on the thumbnail to download our 2022 Education & Traning Guide.